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JMT 2012, Vol. 20 Issue (4) :206-212     DOI: 10.3969/j.issn.2095-087X.2012.04.003
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Propagation characteristics of wideband high-speed railway channel in viaduct scenario at 2.35 GHz
Yunling GUO1, Jianhua ZHANG1, Cheng TAO2, Liu LIU2, Lei TIAN1*
1. Key Laboratory of Universal Wireless Communications (Ministry of Education), Wireless Technology Innovation Institute, Beijing University of Posts and Telecommunications, Beijing 100876, China ;
2. Institute of Broadband Wireless Mobile Communications, Beijing Jiaotong University, Beijing 100044, China

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Abstract In order to obtain accurate characteristics of wireless channels in the viaduct area of China, a channel measurement was taken in a railway viaduct scenario of the Zhengzhou-Xi’an passenger dedicated line with a bandwidth of 50 MHz at 2.35 GHz. The single-slope log-distance model is used to analyze the path-loss (PL), and the distribution of shadow fading (SF) is obtained by statistical methods, which shows that the normal distribution fits the samples well. Ricean K-factor is analyzed by the method of moments, and the variation of K-factor is given along the measured route. Small scale such as delay spread and Doppler behavior are parameterized. Based on empirical channel measurement, this paper can provide parameters for the evaluation and simulation work on viaduct scenarios of high-speed railway.
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Yunling GUO
Jianhua ZHANG
Cheng TAO
Keywordshigh-speed railway   channel measurement   viaduct   path-loss   delay spread   Ricean K-factor   Doppler     
Received 2012-10-21;

This research was supported by the National Science & Technology Pillar Program (No. 2012BAF14B01), the National Natural Science Foundation of China (No. 61171105), and China Mobile Research Institute. The authors thank Weihui Dong from China Mobile Research Institute for his assistance in conducting measurements.

Cite this article:   
Yunling GUO, Jianhua ZHANG, Cheng TAO, Liu LIU, Lei TIAN.Propagation characteristics of wideband high-speed railway channel in viaduct scenario at 2.35 GHz[J]  JMT, 2012,V20(4): 206-212
http://jmt.swjtu.edu.cn/EN/10.3969/j.issn.2095-087X.2012.04.003      or     http://jmt.swjtu.edu.cn/EN/Y2012/V20/I4/206
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